Fractal dimension as part of a computational model to predict ZnO thin films´ thickness

  • Héctor Daniel Molina-Ruiz Universidad Autónoma del Estado de Hidalgo
  • Obed Pérez Cortez Universidad Autónoma del Estado de Hidalgo
  • Heberto Gómez Pozos Universidad Autónoma del Estado de Hidalgo
  • Heydy Castillejos Fernández Universidad Autónoma del Estado de Hidalgo
Keywords: Fractal dimension, Neural network, SEM (scanning electron microscopy), TensorFlow®, Thin film´s thickness

Abstract

As a matter of fact, there exists computational applications on nanometric field, particularly in the scanning electron microscopy´s obtained images (SEM), however, that research field still having researching opportunities. Particularly, present study, it is presented the apparently biunique relation which can be calculated taking in to consideration the thickness of a thin film and its segmented SEM image´s calculated fractal dimension. Throuhg Keras® module, from TensorFlow® library, programing in Colab® by Google®, which uses Python® 3.6.9, integral variables' coefficient from the model were obtained [86.4897 & 87.681694], giving the chance to forecast a thin film´s thickness, based in an arbitrary fractal dimension (i.e. fractal dimension = 1.99, forecasted thickness = 259.7962 [nm]).

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Published
2022-08-31
How to Cite
Molina-Ruiz, H. D., Pérez Cortez, O., Gómez Pozos, H., & Castillejos Fernández, H. (2022). Fractal dimension as part of a computational model to predict ZnO thin films´ thickness. Pädi Boletín Científico De Ciencias Básicas E Ingenierías Del ICBI, 10(Especial3), 40-47. https://doi.org/10.29057/icbi.v10iEspecial3.8940

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